The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Dec. 24, 2008
Applicants:

Rahul Hakoo, Noida, IN;

Chilakala Ravi Kumar, Noida, IN;

Deepak Baranwal, Greater Noida, IN;

Inventors:

Rahul Hakoo, Noida, IN;

Chilakala Ravi Kumar, Noida, IN;

Deepak Baranwal, Greater Noida, IN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/27 (2006.01); G01R 31/02 (2006.01); G01R 31/316 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
Abstract

A low pin interface module is provided for testing an integrated circuit. The interface module includes an input-output module, a controlling module, a processing module and a storage module specific to the integrated circuit to be tested. The interface module reduces the required number of hardware pins in the integrated circuit for a standalone testing without limiting the integrated circuit testing features. A methodology and a control mechanism achieved with the interface module can be used for the standalone testing of any integrated circuit without using a Joint European Test Action Group test logic interface JTAG implemented following the IEEE Standard 1149.1-1990. The interface module is not limited by a particular debugging platform and allows access to all test features in the integrated circuit with a reduced number of hardware pins and thereby leading to enhanced testing speeds on a tester in parallel and a shorter time-to-a market cycle and a lower development cost.


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