The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Oct. 30, 2008
Yasuo Furukawa, Saitama, JP;
Goerschwin Fey, Bremen, JP;
Satoshi Komatsu, Tokyo, JP;
Masahiro Fujita, Tokyo, JP;
Yasuo Furukawa, Saitama, JP;
Goerschwin Fey, Bremen, JP;
Satoshi Komatsu, Tokyo, JP;
Masahiro Fujita, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
The University of Tokyo, Tokyo, JP;
Abstract
Provided is a test apparatus that tests a device under test, including a vector expanding section that sequentially generates a plurality of test vectors; a predicting section that calculates a predicted value for each test vector by simulating an operation of the device under test, the predicted value indicating a prescribed characteristic value of the device under test to be measured while the device under test is supplied with a test signal corresponding to the test vector; a measuring section that obtains a measured value for each test vector by measuring the prescribed characteristic value of the device under test each time the device under test is supplied with a test vector; and a judging section that judges whether the device under test is defective based on a ratio between the predicted value and the measured value corresponding to each test vector.