The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Feb. 15, 2007
Juichi Nakada, Gunma, JP;
Juichi Nakada, Gunma, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Differences in outputs from multiple terminals are easily measured. There is provided a signal measuring device for receiving signals to be measured which are generated by modulating frequency-different signals different in frequency from each other, and are respectively output from different output terminals, including a combiner which combines the signals to be measured output from the output terminals, a quadrature demodulation unit which demodulates a result of the combining carried out by the combiner, an FFT unit which represents a result of the demodulation in the frequency domain, and a characteristic measuring unit, where the characteristic measuring unit measures data for respective frequencies of the result of the demodulation, acquires output-terminal-corresponding data, which correspond to the respective output terminals, based on the data, derives characteristics of the respective output terminals based on the output-terminal-corresponding data, and acquires a difference in the characteristics between the output terminals based on the derived result.