The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Nov. 02, 2011
Applicants:

Keiji Ishibashi, Hyogo, JP;

Hidenori Mikami, Hyogo, JP;

Naoki Matsumoto, Hyogo, JP;

Inventors:

Keiji Ishibashi, Hyogo, JP;

Hidenori Mikami, Hyogo, JP;

Naoki Matsumoto, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 29/12 (2006.01); H01L 31/0256 (2006.01); H01L 29/20 (2006.01); H01L 31/0304 (2006.01); H01L 23/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

A nitride semiconductor wafer is planar-processed by grinding a bottom surface of the wafer, etching the bottom surface by, e.g., KOH for removing a bottom process-induced degradation layer, chamfering by a rubber whetstone bonded with 100 wt %-60 wt % #3000-#600 diamond granules and 0 wt %-40 wt % oxide granules, grinding and polishing a top surface of the wafer, etching the top surface for eliminating a top process-induced degradation layer and maintaining a 0.5 μm-10 μm thick edge process-induced degradation layer.


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