The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2012

Filed:

Mar. 31, 2009
Applicants:

Alex Hsu, Hsinchu, TW;

Shih-chi Fu, Taipei, TW;

Feng-jia Shiu, Jhudong Township, Hsinchu County, TW;

Chia-shiung Tsai, Hsin-Chu, TW;

Inventors:

Alex Hsu, Hsinchu, TW;

Shih-Chi Fu, Taipei, TW;

Feng-Jia Shiu, Jhudong Township, Hsinchu County, TW;

Chia-Shiung Tsai, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/76 (2006.01); H01L 21/00 (2006.01); H01L 23/544 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a method of fabricating a semiconductor device. The method includes providing a device substrate having a front side and a back side, the device substrate having a first refractive index, forming an embedded target over the front side of the device substrate, forming a reflective layer over the embedded target, forming a media layer over the back side of the device substrate, the media layer having a second refractive index less than the first refractive index, and projecting radiation through the media layer and the device substrate from the back side so that the embedded target is detected for a semiconductor process.


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