The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8175828 B1

PDF
Full Text
Expired
Date of Patent:
May. 08, 2012

Filed:

Jan. 18, 2009
Applicants:

Kiyotaka Ichiyama, Saitama, JP;

Masahiro Ishida, Miyagi, JP;

Takahiro Yamaguchi, Miyagi, JP;

Inventors:

Kiyotaka Ichiyama, Saitama, JP;

Masahiro Ishida, Miyagi, JP;

Takahiro Yamaguchi, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is an evaluation apparatus that evaluates a characteristic of a propagation apparatus propagating a signal, comprising an output signal measuring section that measures a probability density function expressing a probability density distribution of jitter of an output signal passed by the propagation apparatus; an isolating section that isolates at least one of a random component of a jitter component and a deterministic component of the jitter component in the jitter of the output signal, from the probability density function of the jitter of the output signal; and an evaluating section that evaluates the characteristic of the propagation apparatus based on the jitter component isolated by the isolating section.


Find Patent Forward Citations

Ichiyama, Kiyotaka. (2012). Evaluation apparatus, evaluation method, program, recording medium and electronic device (U.S. Patent No. 8175828). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8175828

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