The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2012

Filed:

Jul. 19, 2006
Applicants:

Kevin Dean Lucas, Meylan, FR;

Robert Elliott Boone, Austin, TX (US);

James Edward Vasek, Austin, TX (US);

William Louis Wilkinson, Georgetown, TX (US);

Christophe Couderc, Eindhoven, NL;

Inventors:

Kevin Dean Lucas, Meylan, FR;

Robert Elliott Boone, Austin, TX (US);

James Edward Vasek, Austin, TX (US);

William Louis Wilkinson, Georgetown, TX (US);

Christophe Couderc, Eindhoven, NL;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G06F 7/60 (2006.01); G06F 17/50 (2006.01); G06F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and apparatus for designing an integrated circuit by adding a plurality of control points to an integrated circuit wafer design. Each control point has at least one attribute. Then, an integrated circuit wafer is manufactured using the integrated circuit wafer design. A defect on the integrated circuit wafer is then located. The control points are adjusted such that they correspond with the defect.


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