The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2012

Filed:

Nov. 27, 2007
Applicants:

Dong-ryeol Park, Hwaseong-si, KR;

Woo-yeon Jeong, Seoul, KR;

Seok-won Bang, Seoul, KR;

Hyoung-ki Lee, Seongnam-si, KR;

Inventors:

Dong-ryeol Park, Hwaseong-si, KR;

Woo-yeon Jeong, Seoul, KR;

Seok-won Bang, Seoul, KR;

Hyoung-ki Lee, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are an apparatus and method of measuring a distance using structured light. The apparatus includes a binarization unit binarizing an image, an image identification unit identifying an image having connected pixels in the binarized image, a length ratio calculation unit obtaining the length ratio of the major axis of the image having the connected pixels to a minor axis perpendicular to the major axis, a pixel mean calculation unit obtaining the mean of pixel values of the image having the connected pixels, and an image extraction unit extracting an image formed by the light irradiated from the light source, from the images having connected pixels using the length ratio and the mean of the pixel values.


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