The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Oct. 31, 2006
Applicants:
Terry Farren, Fremont, CA (US);
Heng Gong, San Jose, CA (US);
Yong Shen, Saratoga, CA (US);
Jing Zhang, San Jose, CA (US);
Inventors:
Terry Farren, Fremont, CA (US);
Heng Gong, San Jose, CA (US);
Yong Shen, Saratoga, CA (US);
Jing Zhang, San Jose, CA (US);
Assignee:
Hitachi Global Storage Technologies, Netherlands B.V., Amsterdam, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01);
U.S. Cl.
CPC ...
Abstract
One embodiment in accordance with the invention is a method that comprises testing a first number of physical devices using a first test sequence that comprises an item. A second number of physical devices are tested using a second test sequence. It is noted that the second test sequence comprises the item of the first test and a second item.