The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2012

Filed:

Sep. 26, 2011
Applicants:

John Mitchell, Broomfield, CO (US);

Jon Sandberg, Erie, CO (US);

Karen R. Sandberg, Legal Representative, Shelton, WA (US);

Dwight A. Sehler, Longmont, CO (US);

Inventors:

John Mitchell, Broomfield, CO (US);

Jon Sandberg, Erie, CO (US);

Karen R. Sandberg, legal representative, Shelton, WA (US);

Dwight A. Sehler, Longmont, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.


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