The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Aug. 04, 2009
Sunfei Fang, Hopewell Junction, NY (US);
Brian J. Greene, Hopewell Junction, NY (US);
Effendi Leobandung, Hopewell Junction, NY (US);
Qingqing Liang, Hopewell Junction, NY (US);
Edward P. Maciejewski, Hopewell Junction, NY (US);
Yanfeng Wang, Hopewell Junction, NY (US);
Sunfei Fang, Hopewell Junction, NY (US);
Brian J. Greene, Hopewell Junction, NY (US);
Effendi Leobandung, Hopewell Junction, NY (US);
Qingqing Liang, Hopewell Junction, NY (US);
Edward P. Maciejewski, Hopewell Junction, NY (US);
Yanfeng Wang, Hopewell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of forming threshold voltage controlled semiconductor structures is provided in which a conformal nitride-containing liner is formed on at least exposed sidewalls of a patterned gate dielectric material having a dielectric constant of greater than silicon oxide. The conformal nitride-containing liner is a thin layer that is formed using a low temperature (less than 500° C.) nitridation process.