The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2012

Filed:

Oct. 21, 2009
Applicant:

Yoshihiro Hashimoto, Saitama, JP;

Inventor:

Yoshihiro Hashimoto, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01R 27/08 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a test apparatus that tests a device under test, including a power supply that generates supply power supplied to the device under test, a transmission path that transmits the supply power generated by the power supply to the device under test, an intermediate capacitor that is provided between the transmission path and a ground potential, a power supply current measuring section that measures a current flowing through the transmission path at a position closer to the power supply than the intermediate capacitor, a charge and discharge current measuring section that measures a charge and discharge current of the intermediate capacitor, and a load current calculating section that calculates a load current flowing through the device under test based on a sum of the current measured by the power supply current measuring section and the current measured by the charge and discharge current measuring section.


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