The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8164113 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 24, 2012

Filed:

Sep. 22, 2009
Applicants:

Chih-sheng Lin, Tainan County, TW;

Chih-wen Hsiao, Hsinchu County, TW;

Keng-li Su, Hsinchu, TW;

Inventors:

Chih-Sheng Lin, Tainan County, TW;

Chih-Wen Hsiao, Hsinchu County, TW;

Keng-Li Su, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/60 (2006.01); H01L 29/74 (2006.01); H01L 31/111 (2006.01); H01L 23/62 (2006.01); H01L 23/48 (2006.01); H02H 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electrostatic discharge (ESD) structure for a 3-dimensional (3D) integrated circuit (IC) through-silicon via (TSV) device is provided. The ESD structure includes a substrate, a TSV device which is formed through the substrate and is equivalent to a resistance-inductance-capacitance (RLC) device, and at least one ESD device which is disposed in the substrate and electrically connected to one end of the TSV device. The ESD structure can protect the 3D IC TSV device.


Find Patent Forward Citations

Lin, Chih-Sheng. (2012). Electrostatic discharge structure for 3-dimensional integrated circuit through-silicon via device (U.S. Patent No. 8164113). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8164113

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