The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2012

Filed:

Jan. 10, 2008
Applicants:

Takao Tanimoto, Hadano, JP;

Koji Kawakita, Atsugi, JP;

Inventors:

Takao Tanimoto, Hadano, JP;

Koji Kawakita, Atsugi, JP;

Assignee:

Anritsu Corporation, Atsugi-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/22 (2006.01); H04B 10/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an optical phase modulation evaluating device that can measure and evaluate the precise degree of modulation in phase of an optical phase modulation signal in comparison with the conventionally-known optical phase modulation evaluating device. The optical phase modulation evaluating module includes: a bit delay device located on optical paths of the third and fifth light beams, and adapted to change the length of the optical paths to delay the third and fifth light beams by one bit per second; and an optical phase difference setting means for delaying either or both the ninth and tenth light beams by a designated phase angle which is not equal to zero, the optical phase difference setting means having a light transmissive plate located on an optical path for the ninth light beam, and a light transmissive plate located on an optical path for the tenth light beam.


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