The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2012
Filed:
Dec. 02, 2008
John Mitchell, Longmont, CO (US);
Dwight A. Sehler, Longmont, CO (US);
Michael Williamson, Fayetteville, NY (US);
David Rice, Syracuse, NY (US);
Jon Sandberg, Erie, CO (US);
Karen R. Sandberg, Legal Representative, Shelton, WA (US);
John Mitchell, Longmont, CO (US);
Dwight A. Sehler, Longmont, CO (US);
Michael Williamson, Fayetteville, NY (US);
David Rice, Syracuse, NY (US);
Jon Sandberg, Erie, CO (US);
Karen R. Sandberg, legal representative, Shelton, WA (US);
Particle Measuring Systems, Inc., Boulder, CO (US);
Abstract
The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.