The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

Mar. 27, 2009
Applicants:

Kirk M. Rager, Reedsville, PA (US);

Jason Habermehl, Stoneham, CA;

Fabrice Cancre, Lexington, MA (US);

Inventors:

Kirk M. Rager, Reedsville, PA (US);

Jason Habermehl, Stoneham, CA;

Fabrice Cancre, Lexington, MA (US);

Assignee:

Olympus NDT, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/02 (2006.01); G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a method and system which efficiently and accurately identifies an acoustic wedge by as simple as pressing a button to execute a command for a phased array inspection system, once the wedge is engaged with the system. It is based on the approach to use the time of flight that ultrasonic signals travel in the wedge to measure and calculate critical parameters, such as the wedge acoustic velocity, the wedge or incident angle and the height of the first element of the associated phased array probe above the base of the wedge.


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