The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
Jan. 06, 2011
Applicants:
Akihisa Nitta, Yokohama, JP;
Shinichi Yamamoto, Fujisawa, JP;
Hiromichi Horie, Yokosuka, JP;
Inventors:
Assignees:
Kabushiki Kaisha Toshiba, , JP;
Toshiba Materials Co., Ltd., , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
According to one embodiment, there is provided an X-ray tube target. The X-ray tube target has a structure in which a carbon base material is bonded with an Mo base material or Mo alloy base material with a joint layer. The joint layer includes an MoNbTi diffusion phase, an NbTi alloy phase, an Nb-rich phase and a ZrNb alloy phase when the ratios of components in the joint layer are detected by EPMA.
Nitta, Akihisa. (2012). X-ray tube target, x-ray tube using the same, x-ray inspection device and method of producing x-ray tube target (U.S. Patent No. 8149992). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8149992
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile