The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

Sep. 15, 2009
Applicants:

Alf Olsen, Oslo, NO;

Espen A. Olsen, Tustin, CA (US);

Jorgen Moholt, Moss, NO;

Steinar Iversen, Barum, NO;

Dov Avni, Haifa, IL;

Arkady Glukhovsky, Santa Clarita, CA (US);

Inventors:

Alf Olsen, Oslo, NO;

Espen A. Olsen, Tustin, CA (US);

Jorgen Moholt, Moss, NO;

Steinar Iversen, Barum, NO;

Dov Avni, Haifa, IL;

Arkady Glukhovsky, Santa Clarita, CA (US);

Assignees:

Micron Technology, Inc., Boise, ID (US);

Given Imaging, Ltd., Yogneam, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 3/14 (2006.01); H04N 5/335 (2011.01); H04N 5/235 (2006.01); G03B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imager and a method for real-time, non-destructive monitoring of light incident on imager pixels during their exposure to light. Real-time or present pixel signals, which are indicative of present illumination on the pixels, are compared to a reference signal during the exposure. Adjustments, if necessary, are made to programmable parameters such as gain and/or exposure time to automatically control the imager's exposure to the light. In a preferred exemplary embodiment, only a selected number of pixels are monitored for exposure control as opposed to monitoring the entire pixel array.


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