The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2012

Filed:

May. 23, 2008
Applicants:

Kenichi Nagatani, Tokyo, JP;

Atsuo Sawara, Tokyo, JP;

Hiroshi Nakagawa, Tokyo, JP;

Inventors:

Kenichi Nagatani, Tokyo, JP;

Atsuo Sawara, Tokyo, JP;

Hiroshi Nakagawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G01R 31/28 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test apparatus for testing a device under test includes a capture memory that stores thereon an output pattern received from the device under test, a header detecting section that reads the output pattern from the capture memory and detects a portion matching a predetermined header pattern in the output pattern, and a judging section that judges whether the output pattern is acceptable based on a result of comparison between a pattern, in the output pattern, which starts with the portion matching the predetermined header pattern and a corresponding expected value pattern.


Find Patent Forward Citations

Nagatani, Kenichi. (2012). Test apparatus for testing a device under test and device for receiving a signal (U.S. Patent No. 8145965). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8145965

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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