The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2012

Filed:

Mar. 28, 2008
Applicants:

Teiichiro Umezawa, Singapore, SG;

Masafumi Ishiyama, Singapore, SG;

Kenji Ayama, Singapore, SG;

Tokichiro Sato, Singapore, SG;

Inventors:

Teiichiro Umezawa, Singapore, SG;

Masafumi Ishiyama, Singapore, SG;

Kenji Ayama, Singapore, SG;

Tokichiro Sato, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a magnetic recording medium which maintains high S/N ratio and coercive force (Hc) and has high recording density, even with fine magnetic particles, by further improving crystal orientation of a magnetic recording layer. The magnetic recording medium is provided with an orientation control layer (), a nonmagnetic under layer (), and a magnetic recording layer () on a substrate. The orientation control layer () has an fcc structure and a (111) plane parallel to the substrate. The under layer () has an hcp structure and a (0001) plane parallel to the substrate. An atomic distance of the (111) plane of the orientation control layer () is −0.2 Å to +0.15 Å to a lattice spacing of the under layer ().


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