The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2012

Filed:

Dec. 29, 2006
Applicants:

Eric Jian Huang, Eden Prairie, MN (US);

HU Chen, Beijing, CN;

Wenguang Chen, Beijing, CN;

Robert Kuhn, White Heath, IL (US);

Inventors:

Eric Jian Huang, Eden Prairie, MN (US);

Hu Chen, Beijing, CN;

Wenguang Chen, Beijing, CN;

Robert Kuhn, White Heath, IL (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, apparatus, and articles of manufacture to perform runtime trace filtering associated with application performance analysis are disclosed. A disclosed example method involves generating a first performance value based on first performance data associated with a first function of a first application process. A difference value is generated based on the first performance value and a historical performance value associated with the first function. The difference value is compared to a threshold value, and first trace data associated with execution of the first application process is collected based on the comparison of the difference value to the threshold value.


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