The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2012

Filed:

May. 18, 2007
Applicant:

Ian Stephen Gregory, Cambridge, GB;

Inventor:

Ian Stephen Gregory, Cambridge, GB;

Assignee:

TeraView Limited, Cambridge, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus for measurement of a sample comprises means for generating electromagnetic radiation comprising a photoconductive device, the generating means is arranged to generate an output signal comprising electromagnetic radiation in dependence upon radiation received by the photoconductive device and to transmit the output signal towards a sample space, the apparatus further comprises a first radiation source and a second radiation source, arranged such that the radiation received by the photoconductive device comprises a mixture of radiation from the first radiation source and radiation from the second radiation source, control means for varying the frequency of the electromagnetic radiation of the output signal by varying the temperature of the first radiation source and/or the temperature of the second radiation source, and detecting means for detecting a response signal.


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