The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8134357 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 13, 2012

Filed:

May. 11, 2010
Applicants:

Jung-chuan Chou, Yunlin County, TW;

Wei-chuan Chen, Pingtung County, TW;

Cheng-wei Chen, Pingtung County, TW;

Chien-cheng Chen, Taichung County, TW;

Inventors:

Jung-Chuan Chou, Yunlin County, TW;

Wei-Chuan Chen, Pingtung County, TW;

Cheng-Wei Chen, Pingtung County, TW;

Chien-Cheng Chen, Taichung County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a multi-electrode measuring system including a front end device which is a sensing device including a multi-electrode sensing device having a plurality of electrodes; a multi-channel fixture coupled to the multi-electrode sensing device; and a reference electrode. A back-end device as a virtual instrumentation is an electronic device including a read out circuit device coupled to the multi-channel fixture and the reference electrode for receiving each original signal from each electrode of the multi-electrode sensing device and the reference electrode determining a sample solution; a data acquisition device coupled to the read out circuit device for digitizing each original signal to form a digital signal and for array sampling; and a signal processing device coupled to the data acquisition device for processing each signal.


Find Patent Forward Citations

Chou, Jung-Chuan. (2012). Multi-electrode measuring system (U.S. Patent No. 8134357). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8134357

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