The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2012
Filed:
May. 10, 2006
Shigeru Kondo, Tokyo, JP;
Hidekazu Kitazawa, Tokyo, JP;
Toshihisa Kumagai, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
It is possible to provide a semiconductor test program debug device capable of reducing the unnecessary facilities when using a semiconductor test device or a semiconductor test program of different specification. The semiconductor test program debug deviceincludes a virtual devicefor simulating operation of the device under test, a dedicated test bench processing sectionand a general-purpose test bench processing sectionfor generating a pseudo test signal and a response signal inputted/outputted between to/from the virtual device, conversion source program storage sections-for storing a plurality of semiconductor test programs of different specifications, dedicated conversion rule storage sectionsand general-purpose conversion rule storage sectionsfor storing conversion rules corresponding to the respective specifications, and conversion processing sections-for generating the dedicated and the general-purpose bench processing sectionsby using the semiconductor test programs stored in the conversion source program storage sections-