The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2012
Filed:
Feb. 02, 2008
Akinori Koukitu, Fuchu, JP;
Yoshinao Kumagai, Fuchu, JP;
Toru Nagashima, Shunan, JP;
Kazuya Takada, Shunan, JP;
Hiroyuki Yanagi, Shunan, JP;
Akinori Koukitu, Fuchu, JP;
Yoshinao Kumagai, Fuchu, JP;
Toru Nagashima, Shunan, JP;
Kazuya Takada, Shunan, JP;
Hiroyuki Yanagi, Shunan, JP;
Tokuyama Corporation, Shunan-shi, JP;
Tokyo University of Agriculture and Technology, Tokyo, JP;
Abstract
This invention provides a self supporting substrate which consists of a n-type conductive aluminum nitride semiconductor crystal and is useful for manufacturing the vertical conductive type AlN semiconductor device. The n-type conductive aluminum nitride semiconductor crystal, by which the self supporting substrate is made up, contains Si atom at a concentration of 1×10to 5×10cmis substantially free of halogen atoms and substantially does not absorb the light having the energy of not more than 5.9 eV. The self supporting substrate can be obtained by a method comprising the steps of forming an AlN crystal layer on a single crystal substrate such as a sapphire by the HVPE method, preheating the obtained substrate having the AlN crystal layer to a temperature of 1,200° C. or more, forming a second layer consisting of the n-type conductive aluminum nitride semiconductor crystal is formed on the AlN crystal layer in high rate by the HVPE method and separating the second layer from the obtained laminate.