The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2012
Filed:
Feb. 28, 2008
Applicants:
Phillip D. Burlison, Morgan Hill, CA (US);
John K. Frediani, Corralitos, CA (US);
Inventors:
Phillip D. Burlison, Morgan Hill, CA (US);
John K. Frediani, Corralitos, CA (US);
Assignee:
Verigy (Singapore) Pte. Ltd., Singapore, SG;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3183 (2006.01); G01R 31/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
As a scan pattern is shifted out of a scan chain, the scan pattern is evaluated in real-time for the existence of a logic condition. A reference to a portion of the scan pattern that is currently being evaluated is maintained. Upon identifying the existence of the logic condition when the reference has a predetermined relationship to a stored value, the stored value is overwritten using the reference. The stored value is then used to estimate the position of a stuck-at defect in the scan chain.