The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Nov. 06, 2006
Applicants:
Yuichiro Hashimoto, Tokyo, JP;
Hideyuki Kawanabe, Tokyo, JP;
Ryuichi Hirano, Tokyo, JP;
Tetsuya Shirota, Tokyo, JP;
Inventors:
Yuichiro Hashimoto, Tokyo, JP;
Hideyuki Kawanabe, Tokyo, JP;
Ryuichi Hirano, Tokyo, JP;
Tetsuya Shirota, Tokyo, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope system having a selectively mountable optical element, comprises: a first noncontact type storage medium, being equipped in the optical element, for enabling a noncontact readout of information externally; and a first readout unit for reading information non-contactingly from the first noncontact type storage medium, wherein the first noncontact type storage medium stores information related to the optical element.