The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2012
Filed:
Apr. 17, 2008
Applicants:
Brian S. Merrow, Harvard, MA (US);
Eric L. Truebenbach, Sudbury, MA (US);
Marc Lesueur Smith, Sterling, MA (US);
Inventors:
Brian S. Merrow, Harvard, MA (US);
Eric L. Truebenbach, Sudbury, MA (US);
Marc Lesueur Smith, Sterling, MA (US);
Assignee:
Teradyne, Inc., North Reading, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of controlling a temperature of a subject test slot in a cluster of test slots includes evaluating a request for a temperature change for the subject test slot to determine if sufficient power is available to achieve the requested temperature change, and inhibiting the requested temperature change unless or until sufficient power is determined to be available to achieve the requested temperature change.