The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Nov. 11, 2009
Cheng-fu Chen, Yangmei Township, Taoyuan County, TW;
Chien-chou Chen, Taipei, TW;
Yu-fong Tseng, Taoyuan, TW;
Cheng-Fu Chen, Yangmei Township, Taoyuan County, TW;
Chien-Chou Chen, Taipei, TW;
Yu-Fong Tseng, Taoyuan, TW;
Chung Yuan Christian University, Jhong Li, Taoyuan County, TW;
Abstract
A method for measuring a saturated photorefractive index and a recording time constant to correct the precision includes measuring the diffraction efficiency as a function of time for both phase matching and phase mismatching. The saturated photorefractive index and the recording time constant are verified by substitution into a theoretical formula derived from the Coupled Wave Theory. Thus, the method allows a precise determination of the dynamic range of volume holographic memories and thus their storage capacities. The same procedure can also apply to photopolymers.