The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2012
Filed:
Sep. 29, 2004
Juan Jenny LI, Basking Ridge, NJ (US);
David Mandel Weiss, Long Valley, NJ (US);
Howell Stephen Yee, Highlands Ranch, CO (US);
Juan Jenny Li, Basking Ridge, NJ (US);
David Mandel Weiss, Long Valley, NJ (US);
Howell Stephen Yee, Highlands Ranch, CO (US);
Avaya Inc., Basking Ridge, NJ (US);
Abstract
A method for generating test cases for a program is disclosed. The method combines features of path-oriented and goal-oriented software testing. The illustrative embodiment constructs a control-flow graph with nodes that correspond to invocations of subroutines, and constructs control-flow graphs for the source code of such nodes as well. A metric that is based on the topology of the control-flow graph is evaluated recursively for nodes of the graph and for control-flow graphs that correspond to invoked subroutines. In the illustrative embodiment, the metric employed is the length of a shortest path from the starting node to a particular node. A node n with the highest metric value is then selected as a goal, and a path from the starting node to the ending node that passes through node n is generated via backtracking.