The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

Jan. 30, 2009
Applicants:

Chin Ngai Sze, Austin, TX (US);

Charles J. Alpert, Cedar Park, TX (US);

Michael D. Moffitt, Austin, TX (US);

Zhuo LI, Cedar Park, TX (US);

Inventors:

Chin Ngai Sze, Austin, TX (US);

Charles J. Alpert, Cedar Park, TX (US);

Michael D. Moffitt, Austin, TX (US);

Zhuo Li, Cedar Park, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present disclosure is directed to a method for estimating an interconnect delay for a source-to-sink path of a net within a Very Large Scale Integration (VLSI) circuit, the source-to-sink path connecting a source and a sink in the net. The method may comprise estimating a total wire capacitance; calculating a delay contribution based on delay of the source-to-sink path and delay of a plurality of off-path sinks; and estimating the interconnect delay for the source-to-sink path based on the delay contribution.


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