The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2012
Filed:
May. 26, 2010
Wei-cheng Ku, Hsinchu Hsiang, TW;
Chih-hao Ho, Hsinchu Hsiang, TW;
Chia-tai Chang, Hsinchu Hsiang, TW;
Ho-hui Lin, Hsinchu Hsiang, TW;
Chien-ho Lin, Hsinchu Hsiang, TW;
Wei-Cheng Ku, Hsinchu Hsiang, TW;
Chih-Hao Ho, Hsinchu Hsiang, TW;
Chia-Tai Chang, Hsinchu Hsiang, TW;
Ho-Hui Lin, Hsinchu Hsiang, TW;
Chien-Ho Lin, Hsinchu Hsiang, TW;
MPI Corporation, Chu-Pei, TW;
Abstract
A probe for high frequency signal transmission includes a metal pin, and a metal line spacedly arranged on and electrically insulated from the metal pin and electrically connected to grounding potential so as to maintain the characteristic impedance of the probe upon transmitting high frequency signal. The maximum diameter of the probe is substantially equal to or smaller than two times of the diameter of the metal pin. Under this circumstance, a big amount of probes can be installed in a probe card for probing a big amount of electronic devices, so that a wafer-level electronic test can be achieved efficiently and rapidly.