The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2012
Filed:
Mar. 12, 2009
Rubina F. Ahmed, Cary, NC (US);
Moises Cases, Austin, TX (US);
Bradley D. Herrman, Cary, NC (US);
Bhyrav M. Mutnury, Austin, TX (US);
Pravin Patel, Cary, NC (US);
Peter R. Seidel, Cary, NC (US);
Rubina F. Ahmed, Cary, NC (US);
Moises Cases, Austin, TX (US);
Bradley D. Herrman, Cary, NC (US);
Bhyrav M. Mutnury, Austin, TX (US);
Pravin Patel, Cary, NC (US);
Peter R. Seidel, Cary, NC (US);
International Business Macines Corporation, Armonk, NY (US);
Abstract
Testing an electrical component, the component including a printed circuit board ('PCB') with a number of traces, the traces organized in pairs with each trace of a pair carrying current in opposite directions and separated from one another by a substrate layer of the PCB, where testing of the electrical component includes: dynamically and iteratively until a present impedance for a pair of traces of the component is greater than a predetermined threshold impedance: increasing, by an impedance varying device at the behest of a testing device, magnetic field strength of a magnetic field applied to the pair of traces by the impedance varying device, including increasing the present impedance of the pair of traces; measuring, by the testing device, one or more operating parameters; and recording, by the testing device, the measurements of the operating parameters.