The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2012

Filed:

Aug. 13, 2009
Applicants:

Keun-hwl Cho, Seoul, KR;

Dong-won Kim, Seongnam-si, KR;

Jun Seo, Asan-si, KR;

Min-sang Kim, Seoul, KR;

Sung-min Kim, Incheon, KR;

Hyun-jun Bae, Suwon-si, KR;

Ji-myoung Lee, Yongin-si, KR;

Inventors:

Keun-hwl Cho, Seoul, KR;

Dong-won Kim, Seongnam-si, KR;

Jun Seo, Asan-si, KR;

Min-sang Kim, Seoul, KR;

Sung-min Kim, Incheon, KR;

Hyun-jun Bae, Suwon-si, KR;

Ji-Myoung Lee, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/088 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device having a bar type active pattern and a method of manufacturing the same are provided. The semiconductor device may include a semiconductor substrate having a semiconductor fin configured to protrude from a surface of the semiconductor substrate in a first direction, the semiconductor substrate having a first width and a second width crossing the first width, wherein the first width and the second width extend in a second direction. A plurality of active patterns may be arranged in the first direction with a separation gap from the semiconductor fin. A plurality of support patterns may be arranged between the semiconductor fin and one of the plurality of active patterns arranged closer to the semiconductor fin in the first direction, and between the plurality of active patterns arranged in the first direction to support the plurality of active patterns. A gate may be arranged to cross the plurality of active patterns in the second direction and to cover a portion of the at least one of the plurality of active patterns.


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