The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8099633 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 17, 2012

Filed:

Sep. 24, 2007
Applicant:

Makoto Nagano, Tokyo, JP;

Inventor:

Makoto Nagano, Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A USB test circuit for use in a USB device such as a system LSI with a USB function for testing the USB function generates and outputs a packet to be measured for a signal quality test. In the test circuit, a test signal including a test_sin signal carrying operation mode information is inputted via a serial interface to a serial interface block, and a packet to be measured is generated by a data pattern generation block and a transmission data delivery block depending on the operation mode information. The packet to be measured is outputted via a UTMI interface to a USB PHY layer. Thus, a packet to be measured for a signal quality test is generated and outputted without receiving packets not to be measured such as a SETUP packet and a DATA packet, thereby reducing the test time.


Find Patent Forward Citations

Nagano, Makoto. (2012). Circuit for testing a usb device using a packet to be measured controlled by test signals (U.S. Patent No. 8099633). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8099633

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