The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8089714 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 03, 2012

Filed:

Jul. 02, 2010
Applicants:

Kenichi Shitara, Kamisato, JP;

Takao Ishii, Ninomiya, JP;

Inventors:

Kenichi Shitara, Kamisato, JP;

Takao Ishii, Ninomiya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object of the present invention is to provide a deterioration detection method of a head and a magnetic disk inspection apparatus in which the number of times of exchanging the head due to deterioration is decreased to improve the throughput of an inspection. In the present invention, a resistance value detecting circuit that is directly coupled to both terminals of an MR head is provided to measure the resistance value of the MR head, and the measured value is compared with the initial value of the exchanged head, so that it is possible to recognize a deterioration state of each head irrespective of a magnetic disk as a measurement target.


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Shitara, Kenichi. (2012). Deterioration detection method of composite magnetic head and magnetic disk inspection apparatus (U.S. Patent No. 8089714). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8089714

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