The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8089674 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 03, 2012

Filed:

Mar. 08, 2007
Applicants:

Eiichi Hayashi, Kanagawa, JP;

Takamichi Ohhashi, Kanagawa, JP;

Shinya Kamiura, Kanagawa, JP;

Inventors:

Eiichi Hayashi, Kanagawa, JP;

Takamichi Ohhashi, Kanagawa, JP;

Shinya Kamiura, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A first plastic lens and a second plastic lens constituting each imaging optical system are arranged on opposite sides of an optical deflector, so that main scanning directions of optical beams scanned by the single optical deflector become substantially parallel to each other, and the first plastic lens and the second plastic lens of at least one of the plurality of (four) imaging optical systems are formed such that secondary components at scanning positions on the (four) surfaces to be scanned are arranged in a same direction, and are molded by a same mold cavity.


Find Patent Forward Citations

Hayashi, Eiichi. (2012). Optical scanning apparatus, image forming apparatus, and scanning-line-change correcting method (U.S. Patent No. 8089674). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8089674

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