The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2012

Filed:

Sep. 30, 2002
Applicants:

Andrew Arthur Berlin, San Jose, CA (US);

Christopher Marc Gerth, Santa Clara, CA (US);

Tae-woong Koo, South San Francisco, CA (US);

Inventors:

Andrew Arthur Berlin, San Jose, CA (US);

Christopher Marc Gerth, Santa Clara, CA (US);

Tae-Woong Koo, South San Francisco, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

Spectroscopic analysis systems and methods for analyzing samples are disclosed which exploit inelastically scattering radiation to amplify optical signals from an irradiated sample. Samples are irradiated in a chamber having a resonant cavity containing a plurality of affixed reflectors, where selective Stokes scattered radiation is transmitted to a detector for determination of sample identity. Coupling the spectroscopic analysis system and method with a nucleic acid sequencing system is also disclosed for determining nucleic acid sequences.


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