The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2011
Filed:
Oct. 21, 2009
Tomohiro Uematsu, Gunma, JP;
Tomohiro Uematsu, Gunma, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Provided is a test apparatus that tests a device under test, comprising a clock recovering section that recovers a clock signal from an output signal output by the device under test; an acquiring section that acquires the output signal at a timing corresponding to the clock signal; an adjusting section that adjusts a phase difference between the clock signal and the output signal received by the acquiring section, according to an adjustment amount supplied thereto; a setting memory that stores an adjustment amount of the phase difference between the clock signal and the output signal in the acquiring section in association with each of a plurality of test conditions; and a setting section that supplies the adjusting section with an adjustment amount associated with a test condition for testing the device under test, based on the adjustment amounts stored in the setting memory.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile