The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2011
Filed:
Mar. 29, 2007
Takeshi Wada, Ebina, JP;
Hajime Imazeki, Isehara, JP;
Takashi Miyamoto, Hadano, JP;
Anritsu Corporation, Atsugi-shi, JP;
Abstract
The present invention is to provide a signal analyzing apparatus which can easily identify a pattern high in error rate and a pattern causing bit errors in comparison with the conventional device. In a signal analyzing apparatus () for analyzing a signal from an object under test, and having a display unit () display an analysis result on the signal, the signal analyzing apparatus () includes a statistical processing unit () for statistically processing the analysis result for each of divided sections obtained by dividing an analysis section set for the signal; and a display control unit () for causing the display device to display statistical results obtained by the statistical processing unit for each of the divided sections, when a divided section are identified as a new analysis section, the statistical processing unit performs statistical processing of the analysis result for each of divided sections obtained by dividing the new analysis section, the display control unit causes the display device to display the statistical results obtained by the statistical processing unit for each of new divided sections.