The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2011
Filed:
Feb. 11, 2009
Applicants:
Akira Maekawa, Hitachinaka, JP;
Toshiro Saito, Hitachinaka, JP;
Kiyoyuki Kagii, Hitachinaka, JP;
Takayuki Obara, Tsuchiura, JP;
Inventors:
Akira Maekawa, Hitachinaka, JP;
Toshiro Saito, Hitachinaka, JP;
Kiyoyuki Kagii, Hitachinaka, JP;
Takayuki Obara, Tsuchiura, JP;
Assignee:
Hitachi High-Technologies Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides a nucleic acid analyzing apparatus which achieves highly accurate analytical ability even in single molecule DNA analysis. The nucleic acid analyzing apparatus detects locations of fluorescent bright spots in image information about light emission, deletes defective bright spots, and thereby creates intensity trace data about proper bright spots.