The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2011
Filed:
Dec. 03, 2008
Eiji Kanoh, Miyagi, JP;
Makoto Nakanishi, Miyagi, JP;
Tatsuru Orikasa, Miyagi, JP;
Tomoo Yamanouchi, Miyagi, JP;
Eiji Kanoh, Miyagi, JP;
Makoto Nakanishi, Miyagi, JP;
Tatsuru Orikasa, Miyagi, JP;
Tomoo Yamanouchi, Miyagi, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Provided is a spectrum analysis system that measures a signal component at each frequency of an input signal, comprising a sampling section that samples the input signal at prescribed bandwidths to digitize the input signal, and outputs a resulting digital output signal; a converting section that converts the digital output signal from the sampling section into the signal component at each frequency of a unit bandwidth; and an output section that (i) outputs the digital output signal output by the sampling section when a frequency span, which is a frequency range in which the measurement result of the signal component at each frequency of the input signal is output, is greater than or equal to a predetermined reference bandwidth and (ii) outputs the signal component at each frequency converted by the converting section when the frequency span is less than the predetermined reference bandwidth.