The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2011

Filed:

Sep. 09, 2005
Applicants:

Hitoshi Tokieda, Hitachinaka, JP;

Isao Yamazaki, Ryugasaki, JP;

Masaaki Hanawa, Hitachinaka, JP;

Inventors:

Hitoshi Tokieda, Hitachinaka, JP;

Isao Yamazaki, Ryugasaki, JP;

Masaaki Hanawa, Hitachinaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 31/00 (2006.01); G01N 33/00 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automatic analyzer having a smaller size, allowing a larger number of reagents to be loaded, and having a higher processing capability. Reagent disks are disposed inside and outside a reaction disk. Reagent probes are disposed to be able to suck reagents from the reagent disks and eject the reagents at common positions. A plurality of reagent probes are alternately accessed one by one to each of the reagent disks per cycle. Each reagent probe comprises two arms rotatable independently of each other so that the reagent probe is able to access a plurality of points and interference between the plurality of reagent probes can be avoided. A first reagent and a second reagent can be loaded on each of the reagent disks, and the number of loadable reagents can be increased without enlarging an overall system size. Thus, an automatic analyzer having a shorter cycle time and a higher processing capability can be realized.


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