The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2011

Filed:

Nov. 04, 2005
Applicants:

Kiyotaka Ichiyama, Tokyo, JP;

Masahiro Ishida, Tokyo, JP;

Yasuhide Kuramochi, Tokyo, JP;

Takahiro Yamaguchi, Tokyo, JP;

Inventors:

Kiyotaka Ichiyama, Tokyo, JP;

Masahiro Ishida, Tokyo, JP;

Yasuhide Kuramochi, Tokyo, JP;

Takahiro Yamaguchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, having a pulse generator for outputting a pulse signal having a pulse width set in advance corresponding to edges-under-measurement from which the timing jitter is to be measured in the signal-under-measurement, a filter for removing carrier frequency components of the signal-under-measurement from the pulse signal and a jitter calculator for calculating the jitter in the signal-under-measurement based on the signal outputted out of the filter.


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