The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2011

Filed:

Jun. 23, 2009
Applicants:

Ambrish Varma, Nashua, NH (US);

Feras Al-hawari, Hudson, NH (US);

Kumar Keshavan, Medford, MA (US);

Inventors:

Ambrish Varma, Nashua, NH (US);

Feras Al-Hawari, Hudson, NH (US);

Kumar Keshavan, Medford, MA (US);

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and systems are provided for screening and rapid evaluation of routed nets in a post-layout circuit environment, such as in the design of printed circuit boards. A portion of nets are selected for determination of associated signal quality factors. Signal channels containing one or more selected nets are then built. A reference input stimulus is propagated along each of the signal channels in a frequency based simulation for generating characteristic responses of the selected nets' signal channels. A signal channel quality factor is obtained for each signal channel based upon its characteristic response. The signal channels and their nets are then comparatively analyzed according to corresponding signal channel quality factors to selectively identify any aberrant nets warranting supplemental evaluation for faults.


Find Patent Forward Citations

Loading…