The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2011

Filed:

Sep. 05, 2007
Applicants:

Richard C. Dokken, San Ramon, CA (US);

Gerald S. Chan, Saratoga, CA (US);

Jacob J Orbon, Morgan Hill, CA (US);

Alfred L Crouch, Cedar Park, TX (US);

Inventors:

Richard C. Dokken, San Ramon, CA (US);

Gerald S. Chan, Saratoga, CA (US);

Jacob J Orbon, Morgan Hill, CA (US);

Alfred L Crouch, Cedar Park, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for operating a secure semiconductor IP access server to support failure analysis. A client presents a test failure and failure type to an automated server which traverses an electronic product design, definition, and test database to report specifically those components and interconnect likely to cause the failure with geometrical information which may be displayed on the client. Other aspects of semiconductor IP are protected by the server by limiting the trace mechanism and renaming components.


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