The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8060326 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 15, 2011

Filed:

Jan. 21, 2009
Applicants:

Masashi Miyazaki, Gunma, JP;

Hiroshi Ito, Saitama, JP;

Inventors:

Masashi Miyazaki, Gunma, JP;

Hiroshi Ito, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a measurement apparatus including a first timing detecting section that detects first change timings of a signal under measurement, a second timing detecting section that detects second change timings of the signal under measurement, a buffer section that buffers data indicating the first change timings detected by the first timing detecting section and data indicating the second change timings detected by the second timing detecting section, and a calculating section that acquires, from the buffer section, the data indicating the first change timings and the data indicating the second change timings, calculates a temporal relationship between the first change timings and the second change timings, and outputs the temporal relationship.


Find Patent Forward Citations

Miyazaki, Masashi. (2011). Measuring apparatus, measuring method and test apparatus (U.S. Patent No. 8060326). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8060326

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