The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Sep. 30, 2005
Gareth Geoffrey Hougham, Ossining, NY (US);
Ali Afzali, Ossining, NY (US);
Steven Allen Cordes, Yorktown Heights, NY (US);
Paul W. Coteus, Yorktown, NY (US);
Matthew J. Farinelli, Riverdale, NY (US);
Sherif A. Goma, White Plains, NY (US);
Alphonso P. Lanzetta, Marlboro, NY (US);
Daniel Peter Morris, Purchase, NY (US);
Joanna Rosner, Cortlandt Manor, NY (US);
Nisha Yohannan, Yonkers, NY (US);
Gareth Geoffrey Hougham, Ossining, NY (US);
Ali Afzali, Ossining, NY (US);
Steven Allen Cordes, Yorktown Heights, NY (US);
Paul W. Coteus, Yorktown, NY (US);
Matthew J. Farinelli, Riverdale, NY (US);
Sherif A. Goma, White Plains, NY (US);
Alphonso P. Lanzetta, Marlboro, NY (US);
Daniel Peter Morris, Purchase, NY (US);
Joanna Rosner, Cortlandt Manor, NY (US);
Nisha Yohannan, Yonkers, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously through the plane of the carrier. The probe structure includes one or more other contact structures adapted for connection to a test apparatus.