The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2011
Filed:
Nov. 07, 2008
Yanko Konstantinov Sheiretov, Cambridge, MA (US);
Neil J. Goldfine, Newton, MA (US);
Andrew P. Washabaugn, Chule Vista, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Yanko Konstantinov Sheiretov, Cambridge, MA (US);
Neil J. Goldfine, Newton, MA (US);
Andrew P. Washabaugn, Chule Vista, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
JENTEK Sensors, Inc., Waltham, MA (US);
Abstract
A method is provided for performing inverse interpolation that estimates the values of at least two identified parameters. Initially, a database of sensor responses is generated over a range of values for each of the identified parameters. The sensor responses associated with incremental changes in each parameter value form a grid cell. Each corner of a grid cell is a grid point which represents the sensor response for a specific value of each of the identified parameters. A target point of sensor values is obtained from a sensor. The database is searched to identify the grid cell which contains the target point. Using the grid cell corners as reference values, the final estimate of the parameter values is interpolated. In some cases there are three or more parameters to be estimated. The database may include sensor responses computed at multiple excitation frequencies.