The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2011

Filed:

Dec. 21, 2007
Applicant:

Fang Xu, Newton, MA (US);

Inventor:

Fang Xu, Newton, MA (US);

Assignee:

Teradyne, Inc., North Reading, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/38 (2006.01); G06F 17/17 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique for interpolating a series of samples includes constructing a mathematical model of the series that describes its large signal behavior. The model is subtracted from the original series to yield a residue. A discrete Fourier transform (DFT) is taken of the residue, and the DFT is zero-padded. An inverse DFT of the padded result yields an interpolated residue, which is then added back to the mathematical model to construct an interpolated version of the series of samples. Using this technique, accurate interpolation can generally be attained even when the series of samples is not coherently sampled.


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